发明名称 IMAGING APPARATUS FOR THERMAL ANALYSIS DEVICE AND THERMAL ANALYSIS DEVICE INCLUDING TEH SAME
摘要 PROBLEM TO BE SOLVED: To provide an imaging apparatus for a thermal analysis device which is capable of capturing a clear image, when imaging a heated sample in the thermal analysis device through an observation window and capable of suppressing damage of imaging means caused by the heat and to provide the thermal analysis device including the imaging apparatus for the thermal analysis device.SOLUTION: An imaging apparatus for a thermal analysis device 200 which images a heated sample S inside from an observation window W provided in a thermal analysis device body part 150 includes imaging means 230 which includes a lens housing 232 and a main body part 234, a holding part 210 which holds the imaging means, and a cooling fan 220 which is arranged in the holding part. The imaging means is held by the holding part, so that the lens housing is directly directed to the observation window and the main body part is located closer to the side opposite to the observation window than the lens housing. The holding part includes a cooling air passage Pas in which an intake part 212 and an exhaust part 216 are formed. At least a part of the lens housing and the cooling fan are arranged in the cooling air passage. The lens housing is cooled by cooling air Air sent from the cooling fan.
申请公布号 JP2015175618(A) 申请公布日期 2015.10.05
申请号 JP20140049877 申请日期 2014.03.13
申请人 HITACHI HIGH-TECH SCIENCE CORP 发明人 NISHIMURA SHINYA;FUJIWARA HIROTO;YAMADA KENTARO
分类号 G01N25/00;G01N5/04;G01N25/04;G01N25/20 主分类号 G01N25/00
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