| 摘要 |
The present invention relates to a handler for testing a semiconductor device, wherein a semiconductor device is electrically connected to a tester during a test. The handler according to the present invention enables a test tray to conduct loading and unloading at a first height at a work position and electrically connect to the tester at a second height lower than the first height at a test position while reciprocating between the work position and the test position by combining a tray supporting device or a connector with a technology of lowering or raising the test tray. According to the present invention, a handler having a simple structure, a novel shape capable of saving space, and low production costs is disclosed by combining the test tray or the connector with a structure of raising or lowering the test tray to adjust the height of a work surface or the height of a test surface. |
