发明名称 |
TRANSMISSION ELECTRON MICROSCOPE AND METHOD FOR DISPLAYING TRANSMISSION ELECTRON MICROSCOPE IMAGE |
摘要 |
PROBLEM TO BE SOLVED: To provide a transmission electron microscope capable of displaying an image with an emphasized edge in a display unit.SOLUTION: A transmission electron microscope 100 includes: an electron beam source 2 which generates an electron beam EB; an irradiation lens system 4 which irradiates a sample S with the electron beam EB from the electron beam source 2; an objective lens 8 which forms an image of the sample with the transmitted electron beam EB; a projection lens 12 which projects the transmission electron microscope image formed by the objective lens 8; an imaging unit 14 which images the transmission electron microscope image projected by the projection lens 12; a display control unit 22 which controls the display of the transmission electron microscope image imaged by the imaging unit 14 in the display unit 20 at a predetermined reduction ratio; and a control unit 24 which controls the objective lens 8. The control unit 24 controls the amount of insufficient focus on the basis of the reduction ratio. |
申请公布号 |
JP2015176691(A) |
申请公布日期 |
2015.10.05 |
申请号 |
JP20140051240 |
申请日期 |
2014.03.14 |
申请人 |
JEOL LTD |
发明人 |
ISHIKAWA TAKAKI |
分类号 |
H01J37/26;H01J37/21;H01J37/22 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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