发明名称 TRANSMISSION ELECTRON MICROSCOPE AND METHOD FOR DISPLAYING TRANSMISSION ELECTRON MICROSCOPE IMAGE
摘要 PROBLEM TO BE SOLVED: To provide a transmission electron microscope capable of displaying an image with an emphasized edge in a display unit.SOLUTION: A transmission electron microscope 100 includes: an electron beam source 2 which generates an electron beam EB; an irradiation lens system 4 which irradiates a sample S with the electron beam EB from the electron beam source 2; an objective lens 8 which forms an image of the sample with the transmitted electron beam EB; a projection lens 12 which projects the transmission electron microscope image formed by the objective lens 8; an imaging unit 14 which images the transmission electron microscope image projected by the projection lens 12; a display control unit 22 which controls the display of the transmission electron microscope image imaged by the imaging unit 14 in the display unit 20 at a predetermined reduction ratio; and a control unit 24 which controls the objective lens 8. The control unit 24 controls the amount of insufficient focus on the basis of the reduction ratio.
申请公布号 JP2015176691(A) 申请公布日期 2015.10.05
申请号 JP20140051240 申请日期 2014.03.14
申请人 JEOL LTD 发明人 ISHIKAWA TAKAKI
分类号 H01J37/26;H01J37/21;H01J37/22 主分类号 H01J37/26
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