发明名称 RADIATION AND TEMPERATURE HARD MULTI-PIXEL AVALANCHE PHOTODIODES
摘要 The structure and method of fabricating a radiation and temperature hard avalanche photodiode with integrated radiation and temperature hard readout circuit, comprising a substrate, an avalanche region, an absorption region, and a plurality of Ohmic contacts are presented. The present disclosure provides for tuning of spectral sensitivity and high device efficiency, resulting in photon counting capability with decreased crosstalk and reduced dark current.
申请公布号 US2015280045(A1) 申请公布日期 2015.10.01
申请号 US201514667024 申请日期 2015.03.24
申请人 The University of Houston System 发明人 Bensaoula Abdelhak;Starikov David;Pillai Rajeev
分类号 H01L31/107;H01L31/18;H01L31/0352;H01L27/144;H01L31/0304 主分类号 H01L31/107
代理机构 代理人
主权项 1. A photon counting avalanche photodiode device comprising: a substrate having a pixel matrix of transistor structures on a top surface of the substrate; an avalanche region above the substrate comprising doped coalesced nanocolumns having a matching pixel matrix; an absorption region with a matching pixel matrix further comprising: a grading layer on top of the avalanche region,a superlattice layer on top of the grading layer,a capping layer on top of the superlattice layer; and a plurality of Ohmic contacts that provide individual addressing to the transistor and avalanche photodiode structure pixels.
地址 Houston TX US