发明名称 Semiconductor Device and Method of Forming RDL and Vertical Interconnect by Laser Direct Structuring
摘要 A semiconductor device has a semiconductor die and encapsulant deposited over the semiconductor die. An insulating layer is formed over the semiconductor die and encapsulant. A first channel including a first conductive surface is formed in the insulating layer by laser radiation. A laser-activated catalyst is infused in the insulating layer to form the first conductive surface in the first channel upon laser radiation. A vertical interconnect is formed through the encapsulant. A first conductive layer is formed in the first channel over the first conductive surface. A second channel including a second conductive surface is formed in the encapsulant by laser radiation. The catalyst is infused in the encapsulant to form the second conductive surface in the second channel upon laser radiation. A second conductive layer is formed in the second channel over the second conductive surface. An interconnect structure is formed over the first conductive layer.
申请公布号 US2015279778(A1) 申请公布日期 2015.10.01
申请号 US201414228531 申请日期 2014.03.28
申请人 STATS ChipPAC, Ltd. 发明人 Camacho Zigmund R.;Liao Bartholomew;Alvarez Sheila Marie L.;Chi HeeJo;Dao Kelvin
分类号 H01L23/528;H01L23/31;H01L23/00;H01L21/56;H01L21/768 主分类号 H01L23/528
代理机构 代理人
主权项 1. A method of making a semiconductor device, comprising: providing a semiconductor die; depositing an encapsulant over the semiconductor die; forming an insulating layer over the semiconductor die and encapsulant; forming a first channel including a first conductive surface in the insulating layer by laser radiation; forming a first conductive layer in the first channel over the first conductive surface; and forming an interconnect structure over the first conductive layer.
地址 Singapore SG