发明名称 INTEGRATED CIRCUIT DYNAMIC DE-AGING
摘要 An integrated circuit dynamically compensates for circuit aging by measuring the aging with an aging sensor. The aging sensor uses the same circuit to measure circuit speeds in both aged and un-aged conditions. An example aging sensor includes two delay lines. The delay lines are controlled to be in a static aging state or the delay lines are coupled to form a ring oscillator that can operate in an aged state where the frequency is slowed by aging or in an un-aged state where the frequency is not slowed by aging. The integrated circuit uses the aging measurements for dynamic voltage and frequency scaling. The dynamic voltage and frequency scaling uses a table of operating frequencies and corresponding voltage that is periodically updated based on the aging measurements. The integrated circuit use information about the relationship between the aging measurements and circuit performance to update the table.
申请公布号 US2015277393(A1) 申请公布日期 2015.10.01
申请号 US201414507679 申请日期 2014.10.06
申请人 QUALCOMM Incorporated 发明人 Liu Jonathan;Ibrahimovic Jasmin Smaila;Diffenderfer Jan Christian;Auyon Carlos
分类号 G05B11/01;H03K5/01;H03K3/012;G01R31/28 主分类号 G05B11/01
代理机构 代理人
主权项 1. A circuit for sensing aging of an integrated circuit, comprising: a first delay chain having a first input and a first output; a second delay chain having a second input and a second output; and a control module configured to place the first delay chain and the second delay chain in an aging state, an aged oscillating state, or a non-aged oscillating state.
地址 San Diego CA US