发明名称 III-N TRANSISTORS WITH ENHANCED BREAKDOWN VOLTAGE
摘要 Techniques related to III-N transistors having enhanced breakdown voltage, systems incorporating such transistors, and methods for forming them are discussed. Such transistors include a hardmask having an opening over a substrate, a source, a drain, and a channel between the source and drain, and a portion of the source or the drain disposed over the opening of the hardmask.
申请公布号 WO2015147816(A1) 申请公布日期 2015.10.01
申请号 WO2014US31903 申请日期 2014.03.26
申请人 INTEL CORPORATION;THEN, HAN WUI;CHU-KUNG, BENJAMIN;DASGUPTA, SANSAPTAK;CHAU, ROBERT;SUNG, SEUNG HOON;PILLARISETTY, RAVI;RADOSAVLJEVIC, MARKO 发明人 THEN, HAN WUI;CHU-KUNG, BENJAMIN;DASGUPTA, SANSAPTAK;CHAU, ROBERT;SUNG, SEUNG HOON;PILLARISETTY, RAVI;RADOSAVLJEVIC, MARKO
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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