发明名称 FIN-TYPE FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD THEREOF
摘要 A fin-type field effect transistor includes a semiconductor body formed on a substrate, the semiconductor body having a top surface and a pair of laterally opposite sidewalls, and a gate electrode formed above the sidewalls and the top surface of the semiconductor body. The semiconductor body further includes a source region formed on an end portion of the semiconductor body, a drain region formed on another end portion of the semiconductor body, and a channel region formed between the source region and the drain region and surrounded by the gate electrode, wherein a doping concentration of the channel region decreases with increasing distance from the top surface and the sidewalls.
申请公布号 US2015279933(A1) 申请公布日期 2015.10.01
申请号 US201514622609 申请日期 2015.02.13
申请人 Semiconductor Manufacturing International (Shanghai) Corporation 发明人 XIAO Deyuan;WU Hanming;CAI MengFeng;YU Shaofeng;LEE ShiuhWuu
分类号 H01L29/06;H01L21/225;H01L21/306;H01L29/10;H01L29/78;H01L29/66 主分类号 H01L29/06
代理机构 代理人
主权项 1. A fin-type field effect transistor comprising: a semiconductor body formed on a substrate, the semiconductor body having a top surface and a pair of laterally opposite sidewalls; and a gate electrode formed above the sidewalls and the top surface of the semiconductor body, wherein the semiconductor body further comprises: a source region formed on an end portion of the semiconductor body,a drain region formed on another end portion of the semiconductor body, and a channel region formed between the source region and the drain region and surrounded by the gate electrode,wherein a doping concentration of the channel region decreases with increasing distance from the top surface and the sidewalls.
地址 Shanghai CN