发明名称 |
FIN-TYPE FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD THEREOF |
摘要 |
A fin-type field effect transistor includes a semiconductor body formed on a substrate, the semiconductor body having a top surface and a pair of laterally opposite sidewalls, and a gate electrode formed above the sidewalls and the top surface of the semiconductor body. The semiconductor body further includes a source region formed on an end portion of the semiconductor body, a drain region formed on another end portion of the semiconductor body, and a channel region formed between the source region and the drain region and surrounded by the gate electrode, wherein a doping concentration of the channel region decreases with increasing distance from the top surface and the sidewalls. |
申请公布号 |
US2015279933(A1) |
申请公布日期 |
2015.10.01 |
申请号 |
US201514622609 |
申请日期 |
2015.02.13 |
申请人 |
Semiconductor Manufacturing International (Shanghai) Corporation |
发明人 |
XIAO Deyuan;WU Hanming;CAI MengFeng;YU Shaofeng;LEE ShiuhWuu |
分类号 |
H01L29/06;H01L21/225;H01L21/306;H01L29/10;H01L29/78;H01L29/66 |
主分类号 |
H01L29/06 |
代理机构 |
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代理人 |
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主权项 |
1. A fin-type field effect transistor comprising:
a semiconductor body formed on a substrate, the semiconductor body having a top surface and a pair of laterally opposite sidewalls; and a gate electrode formed above the sidewalls and the top surface of the semiconductor body, wherein the semiconductor body further comprises:
a source region formed on an end portion of the semiconductor body,a drain region formed on another end portion of the semiconductor body, and a channel region formed between the source region and the drain region and surrounded by the gate electrode,wherein a doping concentration of the channel region decreases with increasing distance from the top surface and the sidewalls. |
地址 |
Shanghai CN |