发明名称 TRENCH FORMING METHOD, METAL WIRING FORMING METHOD, AND METHOD OF MANUFACTURING THIN FILM TRANSISTOR ARRAY PANEL
摘要 A method of forming a thin film transistor array panel includes: forming a first insulating layer on a substrate; forming an amorphous carbon layer on the first insulating layer; forming a second insulating layer on the amorphous carbon layer; forming an opening in the amorphous carbon layer by patterning the second insulating layer and the amorphous carbon layer; and forming a trench in the first insulating layer by etching the first insulating layer, the etching the first insulating layer using the amorphous carbon layer including the opening as a mask.
申请公布号 US2015279690(A1) 申请公布日期 2015.10.01
申请号 US201514735306 申请日期 2015.06.10
申请人 Samsung Display Co., Ltd. 发明人 RYU Yong-Hwan;KIM Dae Ho;PARK Hong Sick;CHOI Shin Il
分类号 H01L21/311;H01L21/308;H01L27/12;H01L21/321 主分类号 H01L21/311
代理机构 代理人
主权项 1. A method of forming a thin film transistor array panel, the method comprising: providing a first insulating layer on a substrate; providing an amorphous carbon layer on the first insulating layer; providing a second insulating layer on the amorphous carbon layer; patterning the second insulating layer and the amorphous carbon layer, to form an opening in the amorphous carbon layer; etching the first insulating layer by using the amorphous carbon layer comprising the opening as a mask, to form a trench in the first insulating layer; removing the amorphous carbon layer; providing a metal layer on the substrate; and polishing the metal layer through a chemical mechanical polishing process, to form a metal wiring in the trench.
地址 Yongin-City KR