发明名称 |
TRENCH FORMING METHOD, METAL WIRING FORMING METHOD, AND METHOD OF MANUFACTURING THIN FILM TRANSISTOR ARRAY PANEL |
摘要 |
A method of forming a thin film transistor array panel includes: forming a first insulating layer on a substrate; forming an amorphous carbon layer on the first insulating layer; forming a second insulating layer on the amorphous carbon layer; forming an opening in the amorphous carbon layer by patterning the second insulating layer and the amorphous carbon layer; and forming a trench in the first insulating layer by etching the first insulating layer, the etching the first insulating layer using the amorphous carbon layer including the opening as a mask. |
申请公布号 |
US2015279690(A1) |
申请公布日期 |
2015.10.01 |
申请号 |
US201514735306 |
申请日期 |
2015.06.10 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
RYU Yong-Hwan;KIM Dae Ho;PARK Hong Sick;CHOI Shin Il |
分类号 |
H01L21/311;H01L21/308;H01L27/12;H01L21/321 |
主分类号 |
H01L21/311 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a thin film transistor array panel, the method comprising:
providing a first insulating layer on a substrate; providing an amorphous carbon layer on the first insulating layer; providing a second insulating layer on the amorphous carbon layer; patterning the second insulating layer and the amorphous carbon layer, to form an opening in the amorphous carbon layer; etching the first insulating layer by using the amorphous carbon layer comprising the opening as a mask, to form a trench in the first insulating layer; removing the amorphous carbon layer; providing a metal layer on the substrate; and polishing the metal layer through a chemical mechanical polishing process, to form a metal wiring in the trench. |
地址 |
Yongin-City KR |