发明名称 |
COMPOSITION FOR FORMING PROTECTIVE LAYER, LAMINATE AND KIT |
摘要 |
Provided are: a composition for forming a protective layer, which is not susceptible to the formation of a recessed and projected pattern in a silicon substrate-side surface (polished surface) of a device wafer after polishing of a silicon substrate of the device wafer, and which is capable of adequately forming an electrode at a high temperature by a CVD process; a laminate which has a protective layer that is obtained using this composition for forming a protective layer; and this composition for forming a protective layer. A composition for forming a protective layer for bonding a wafer and a supporting substrate with each other, which contains a resin having a melt flow rate of 4-150 g/10 min or less at 200˚C under a load of 10 kg in accordance with JIS K-7210. This composition for forming a protective layer has a Young's modulus of 0.02 GPa or less in accordance with JIS K-7127. |
申请公布号 |
WO2015146950(A1) |
申请公布日期 |
2015.10.01 |
申请号 |
WO2015JP58832 |
申请日期 |
2015.03.24 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
YOSHIDA MASAFUMI;KOYAMA ICHIRO |
分类号 |
H01L21/02;H01L21/304;H01L21/683 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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