发明名称 COMPOSITION FOR FORMING PROTECTIVE LAYER, LAMINATE AND KIT
摘要 Provided are: a composition for forming a protective layer, which is not susceptible to the formation of a recessed and projected pattern in a silicon substrate-side surface (polished surface) of a device wafer after polishing of a silicon substrate of the device wafer, and which is capable of adequately forming an electrode at a high temperature by a CVD process; a laminate which has a protective layer that is obtained using this composition for forming a protective layer; and this composition for forming a protective layer. A composition for forming a protective layer for bonding a wafer and a supporting substrate with each other, which contains a resin having a melt flow rate of 4-150 g/10 min or less at 200˚C under a load of 10 kg in accordance with JIS K-7210. This composition for forming a protective layer has a Young's modulus of 0.02 GPa or less in accordance with JIS K-7127.
申请公布号 WO2015146950(A1) 申请公布日期 2015.10.01
申请号 WO2015JP58832 申请日期 2015.03.24
申请人 FUJIFILM CORPORATION 发明人 YOSHIDA MASAFUMI;KOYAMA ICHIRO
分类号 H01L21/02;H01L21/304;H01L21/683 主分类号 H01L21/02
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