发明名称 LIGHT SOURCE-ADJUSTING METHOD, EXPOSURE METHOD, AND DEVICE-MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an optimization method of an illumination light source shape for forming a pattern on an object.SOLUTION: An optimization method of an illumination light source shape comprises: steps 202 to 212 of obtaining the light source shape as a target, as a result of SMO [Source and Mask Optimization] (SMO solution) being a method of optimization calculation optimizing a pattern of a mask and an illumination light source, controlling a spatial light modulator such that deviations from the target fall in an allowable range and setting the illumination light source shape (light source shape); steps 220 and 222 of forming an image of the pattern obtained as the result of SMO (SMO solution) by using illumination light from the illumination light source having the light source shape set, on a wafer, and evaluating OPE (Optical Proximity Effect) as imaging performance by using a detection result (line width error) of detection of the image of the formed pattern as an evaluation index; and steps 222 and 218 of optimizing the light source shape on the basis of an evaluation result of the OPE.
申请公布号 JP2015172750(A) 申请公布日期 2015.10.01
申请号 JP20150077395 申请日期 2015.04.06
申请人 NIKON CORP 发明人 MATSUYAMA TOMOYUKI;KITA HISANORI
分类号 G03F7/20 主分类号 G03F7/20
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