| 摘要 |
<p>The present invention relates to a handler for testing a semiconductor device which is used when testing a produced semiconductor device. The handler for testing a semiconductor device according to the present invention comprises: a stacker provided to be movable for supplying or storing a customer tray; and a position selector which can select a position of the stacker by moving the same. Accordingly, the handler, in which the present invention is applied, sequentially performs mass quantities of a semiconductor device on the same test process by effectively operating the stacker, and sequentially performs quantities of different lots. In addition the handler can reduce a space and the production cost by preventing to enlarge equipment or to complicatedly design, and can reduce the man power and increase the operation rate of equipment.</p> |
