发明名称 MEASURING APPARATUS AND MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a measuring apparatus and a measuring method capable of measuring further easily a deflection reflectance characteristic near the regular reflection direction on an object surface.SOLUTION: A measuring system is provided so that light reflected from an object 201 is collected by a lens unit 105 and inputted into a sensor unit 107. Then, each output value of the sensor unit 107 corresponding to a plurality of open angles &bgr; obtained by changing an open angle &bgr; of the lens unit 105 is acquired, and a deflection reflectance characteristic near the regular reflection direction on the surface of the object 201 is acquired from correspondence between the open angle &bgr; and the output value.
申请公布号 JP2015172556(A) 申请公布日期 2015.10.01
申请号 JP20140049314 申请日期 2014.03.12
申请人 CANON INC 发明人 SETO TAKAHIRO
分类号 G01N21/57 主分类号 G01N21/57
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