摘要 |
PROBLEM TO BE SOLVED: To provide a measuring apparatus and a measuring method capable of measuring further easily a deflection reflectance characteristic near the regular reflection direction on an object surface.SOLUTION: A measuring system is provided so that light reflected from an object 201 is collected by a lens unit 105 and inputted into a sensor unit 107. Then, each output value of the sensor unit 107 corresponding to a plurality of open angles &bgr; obtained by changing an open angle &bgr; of the lens unit 105 is acquired, and a deflection reflectance characteristic near the regular reflection direction on the surface of the object 201 is acquired from correspondence between the open angle &bgr; and the output value. |