发明名称 Optical Measuring System for Measuring Optical Polarization Properties of a Sample
摘要 An optical measuring system measures polarization optical properties of a sample. The system includes (a) a light source that emits measuring light along an optical axis of an analysis beam path, (b) a polarization state generator, arranged downstream with respect to the light source in the analysis beam path which provides light with a defined polarization state, (c) a sample holder, arranged downstream with respect to the polarization state generator in the analysis beam path which accommodates the sample, (d) a polarization state analyzer, arranged downstream with respect to the sample holder in the analysis beam path which measures the polarization state of the measuring light after passing through the sample, and (e) a mechanical support structure, at which at least the polarization state generator, the sample holder and the polarization state analyzer are directly attached. Also described is a method for producing such an optical measuring system.
申请公布号 US2015276581(A1) 申请公布日期 2015.10.01
申请号 US201514668880 申请日期 2015.03.25
申请人 Anton Paar GmbH 发明人 Ostermeyer Martin
分类号 G01N21/21;G01N21/05;G01N21/03;G01N21/01 主分类号 G01N21/21
代理机构 代理人
主权项 1. Optical measuring system for measuring optical polarization properties of a sample, the optical measuring system, comprising: a light source, adapted to emit measuring light along an optical axis of an analysis beam path of the optical measuring system; a polarization state generator which is arranged downstream with respect to the light source in the analysis beam path and configured to provide the measuring light with a defined polarization state; a sample holder, which is arranged downstream with respect to the polarization state generator in the analysis beam path and which is designed to accommodate the sample to be measured; a polarization state analyzer, which is arranged downstream with respect to the sample holder in the analysis beam path and which is configured to measure the polarization state of the measuring light after passing through the sample; and a mechanical support structure, at which at least the polarization state generator, the sample holder and the polarization state analyzer are directly attached.
地址 Graz AT
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