发明名称 |
ICP Emission Spectrometer |
摘要 |
An ICP emission spectrometer is schematically configured to include an inductively coupled plasma generation unit, a light condensing unit, a spectroscope, a two-dimensional detection unit and a controller. The two-dimensional detection unit includes a CCD image sensor which has multiple pixels laid in a planar shape and detects emission light by causing the emission light emitted from the spectroscope to be imaged on the multiple pixels. Then, the controller determines a pixel used in detecting the emission light among the multiple pixels in accordance with an imaging shape of detection-targeted emission light. |
申请公布号 |
US2015276484(A1) |
申请公布日期 |
2015.10.01 |
申请号 |
US201514674052 |
申请日期 |
2015.03.31 |
申请人 |
Hitachi High-Tech Science Corporation |
发明人 |
Matsuzawa Osamu |
分类号 |
G01J3/443;G01N21/73 |
主分类号 |
G01J3/443 |
代理机构 |
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代理人 |
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主权项 |
1. An ICP emission spectrometer comprising:
an inductively coupled plasma generation unit configured to obtain atomic emission lines by atomizing or ionizing an analysis-targeted element using inductively coupled plasma; a spectroscope configured to diffract and detect the atomic emission lines; a two-dimensional detection unit having multiple pixels laid in a planar shape and configured to detect emission light by causing the emission light emitted from the spectroscope to be imaged on the multiple pixels; and a controller configured to determine a pixel used in detecting the emission light among the multiple pixels in accordance with an imaging shape of the emission light as a detection target. |
地址 |
Tokyo JP |