发明名称 ICP Emission Spectrometer
摘要 An ICP emission spectrometer is schematically configured to include an inductively coupled plasma generation unit, a light condensing unit, a spectroscope, a two-dimensional detection unit and a controller. The two-dimensional detection unit includes a CCD image sensor which has multiple pixels laid in a planar shape and detects emission light by causing the emission light emitted from the spectroscope to be imaged on the multiple pixels. Then, the controller determines a pixel used in detecting the emission light among the multiple pixels in accordance with an imaging shape of detection-targeted emission light.
申请公布号 US2015276484(A1) 申请公布日期 2015.10.01
申请号 US201514674052 申请日期 2015.03.31
申请人 Hitachi High-Tech Science Corporation 发明人 Matsuzawa Osamu
分类号 G01J3/443;G01N21/73 主分类号 G01J3/443
代理机构 代理人
主权项 1. An ICP emission spectrometer comprising: an inductively coupled plasma generation unit configured to obtain atomic emission lines by atomizing or ionizing an analysis-targeted element using inductively coupled plasma; a spectroscope configured to diffract and detect the atomic emission lines; a two-dimensional detection unit having multiple pixels laid in a planar shape and configured to detect emission light by causing the emission light emitted from the spectroscope to be imaged on the multiple pixels; and a controller configured to determine a pixel used in detecting the emission light among the multiple pixels in accordance with an imaging shape of the emission light as a detection target.
地址 Tokyo JP