发明名称 ANALYTICAL APPARATUS SYSTEM, AND METHOD
摘要 A specimen analysis system includes a first information processing unit and a second information processing unit. Each unit includes a storage unit storing programs executing the information processing, and attribute information indicating attributes of the programs, and a processing unit that performs the information processing by executing the programs stored in the storage unit. The processing unit of a first apparatus acquires attribute information of programs stored in a second apparatus, extracts programs for processing from the first analytical apparatus, from programs stored in the second apparatus based on attribute information from the second apparatus. When a first specimen analysis even occurs, the first apparatus transmits a process request to the second apparatus, which stores a program selected from the extracted programs.
申请公布号 US2015276705(A1) 申请公布日期 2015.10.01
申请号 US201514669119 申请日期 2015.03.26
申请人 SYSMEX CORPORATION 发明人 MAEDA Naoya;FUJINO Hiroyuki;ASADA Mieko
分类号 G01N33/48;G06F9/54;G06F3/0484 主分类号 G01N33/48
代理机构 代理人
主权项 1. An analytical apparatus system comprising: a first specimen analytical apparatus including a first measurement unit that measures a specimen, anda first information processing unit that processes an information regarding measurement of the specimen; and a second specimen analytical apparatus communicably connected to the first specimen analytical apparatus, the second specimen analytical apparatus including a second measurement unit that measures a specimen, anda second information processing unit that processes an information regarding of measurement the specimen, wherein each of the first information processing unit and the second information processing unit includes a storage unit that stores programs to execute the information processing, and attribute information indicating attributes of the programs, anda processing unit that executes the programs stored in the storage unit and processes an information regarding to measuring the specimen, and the processing unit of the first specimen analytical apparatus acquires the attribute information on the programs stored in the second specimen analytical apparatus, extracts programs, which are applicable to processing of an event occurring in the first specimen analytical apparatus, out of the programs stored in the second specimen analytical apparatus on the basis of the attribute information acquired from the second specimen analytical apparatus, and when the event occurs in the first specimen analytical apparatus, transmits a request to process the event to the second specimen analytical apparatus, which stores a program selected from the extracted programs.
地址 Kobe-shi JP