INSPECTION DEVICE, INSPECTION METHOD AND PRODUCTION METHOD FOR ORGANIC EL DEVICE

摘要

Provided is an inspection device for an organic EL device, said inspection device being provided with: a conducting portion that makes contact with a conducting region of at least one organic EL element while gripping a substrate, moves the organic EL element so as to be sent downstream, releases the substrate that has been gripped, can be moved upstream so as to be able to make contact with a conducting region of an upstream organic EL element while gripping the substrate, and can cause the organic EL element to emit light by conducting electricity to the conducting region while gripping the substrate; and an inspection unit for inspecting the light emission state of an organic EL element that has been caused to emit light.