发明名称 INTERFERENCE OBSERVATION DEVICE AND INTERFERENCE OBSERVATION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide an interference observation device and interference observation method capable of simultaneously achieving both of improvement of the lateral resolution and extension of the image depth.SOLUTION: The interference observation device includes: an interferometer for generating interference light by interfering the measuring light having a plurality of wavelengths having passed through a measurement arm with reference light having a plurality of wavelengths having passed through a reference arm; a detection unit for converting the interference light into scattering potential information of an object; a scan unit for scanning the reference surface of the object at a collecting point of the measuring light by an objective lens disposed in the measurement arm; and off-set units 24 and 25 for providing different optical length off-sets between N types of measuring light individually passing through N different partial openings of the objective lens.</p>
申请公布号 JP2015172549(A) 申请公布日期 2015.10.01
申请号 JP20140049060 申请日期 2014.03.12
申请人 NIKON CORP 发明人 NAKAYAMA SHIGERU;YAZAWA HIRONORI;HOSHINO TETSURO
分类号 G01B9/02;G01B11/24;G01N21/17 主分类号 G01B9/02
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