发明名称 |
INTERFERENCE OBSERVATION DEVICE AND INTERFERENCE OBSERVATION METHOD |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide an interference observation device and interference observation method capable of simultaneously achieving both of improvement of the lateral resolution and extension of the image depth.SOLUTION: The interference observation device includes: an interferometer for generating interference light by interfering the measuring light having a plurality of wavelengths having passed through a measurement arm with reference light having a plurality of wavelengths having passed through a reference arm; a detection unit for converting the interference light into scattering potential information of an object; a scan unit for scanning the reference surface of the object at a collecting point of the measuring light by an objective lens disposed in the measurement arm; and off-set units 24 and 25 for providing different optical length off-sets between N types of measuring light individually passing through N different partial openings of the objective lens.</p> |
申请公布号 |
JP2015172549(A) |
申请公布日期 |
2015.10.01 |
申请号 |
JP20140049060 |
申请日期 |
2014.03.12 |
申请人 |
NIKON CORP |
发明人 |
NAKAYAMA SHIGERU;YAZAWA HIRONORI;HOSHINO TETSURO |
分类号 |
G01B9/02;G01B11/24;G01N21/17 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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