发明名称 |
CROSS-POINT MEMORY COMPENSATION |
摘要 |
The apparatuses and methods described herein may operate to measure a voltage difference between a selected access line and a selected sense line associated with a selected cell of a plurality of memory cells of a memory array. The voltage difference may be compared with a reference voltage specified for a memory operation. A selection voltage(s) applied to the selected cell for the memory operation may be adjusted responsive to the comparison, such as to dynamically compensate for parasitic voltage drop. |
申请公布号 |
US2015279460(A1) |
申请公布日期 |
2015.10.01 |
申请号 |
US201514739798 |
申请日期 |
2015.06.15 |
申请人 |
Micron Technology, Inc. |
发明人 |
Liu Zengtao T.;Prall Kirk D. |
分类号 |
G11C13/00 |
主分类号 |
G11C13/00 |
代理机构 |
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代理人 |
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主权项 |
1. An apparatus, comprising:
a memory array including a plurality of memory cells; and a compensator to implement compensation with a selection voltage applied to a selected cell of the plurality of memory cells, wherein the compensator is to measure a voltage difference between a selected access line a selected sense line associated with the selected cell and to refrain from implementing the compensation responsive to the selected cell being located in a specified area of the memory array. |
地址 |
Boise ID US |