INSPECTION DEVICE, INSPECTION METHOD, AND PRODUCTION METHOD FOR ORGANIC EL DEVICE

摘要

Provided is an inspection device for an organic EL device, said inspection device being provided with: a support portion that supports an organic EL device substrate and sends an organic EL element in a length direction; a roller-shaped conducting portion that, by rotating and sequentially making contact with first and second conducting regions of a plurality of organic EL elements that are supported by the support portion, conducts electricity to first and second electrode layers, thereby causing the organic EL elements to emit light; and an inspection unit for inspecting the light emission state of the organic EL elements.