| 摘要 |
The present invention relates to a contact probe for large current electrically connecting a contact point to be inspected of an object to be inspected, and a contact point of an inspecting circuit. The contact probe according to the present invention includes: a first plunger which is in contact with the contact point to be inspected; a second plunger which is in contact with the contact point to be inspected; a barrel for supporting at least one among the first plunger, and the second plunger to be slide movable; and a spring arranged between the first plunger and the second plunger in the barrel. In any one among the first plunger and the second plunger, an insulating member having an open hole for storing one end of the spring is arranged. The other among the first plunger and the second plunger includes a stamp for supporting the other end by storing the spring. A free end of the stamp places at least the open hole of the insulating member after completing spring compression according to an inspection. |
