发明名称 |
Flash memory device and method for manufacturing the same |
摘要 |
A flash memory device includes a semiconductor substrate, a gate insulating layer having a first width formed on the semiconductor substrate to trap carriers tunneled from the semiconductor substrate and a metal electrode on the gate insulating layer to receive a voltage required for tunneling. The metal electrode having a second width smaller than the first width. The flash memory device further includes a sidewall spacer surrounding a side surface of the metal electrode to prevent oxidation of the metal electrode.
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申请公布号 |
US2008093660(A1) |
申请公布日期 |
2008.04.24 |
申请号 |
US20070653166 |
申请日期 |
2007.01.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK HEE-SOOK;LEE BYUNG-HAK;CHA TAE-HO;SOHN WOONG-HEE;LEE JANG-HEE;PARK JAE-HWA |
分类号 |
H01L29/792;H01L21/336 |
主分类号 |
H01L29/792 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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