| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor memory element and a semiconductor memory device that are designed for shortening the time necessary for testing a plurality of semiconductor memory elements. SOLUTION: The semiconductor memory element is provided with a first memory part for storing identification information for identifying a semiconductor memory element from another, a conversion part for converting a control signal, based on the stored identification information, a second memory part for storing data and controlling the input/output of data based on the converted control signal, and a conversion control part for controlling the presence of conversion of the conversion part based on a test state signal that indicating a testing state or no testing state. COPYRIGHT: (C)2008,JPO&INPIT
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