发明名称 Insulated gate semiconductor device and method for manufacturing same
摘要 In an insulated gate semiconductor device ( 1 ) having an N<SUP>-</SUP> type base region ( 11 ), P<SUP>+</SUP> type collector regions ( 12 ), P type base regions ( 13 ), and N<SUP>+</SUP>type emitter regions ( 14 ), an N<SUP>+</SUP> type collector-short region ( 15 ) which extends toward the N<SUP>-</SUP> type base region ( 11 ) farther than the P<SUP>+</SUP> type collector regions ( 12 ) is formed in the lower surface of the N<SUP>-</SUP> type base region ( 11 ), and a P<SUP>+</SUP> type semiconductor region ( 16 ) is formed between the N<SUP>+</SUP> type collector-short region ( 15 ) and the N<SUP>-</SUP> type base region ( 11 ).
申请公布号 US2008093623(A1) 申请公布日期 2008.04.24
申请号 US20050591009 申请日期 2005.04.05
申请人 SANKEN ELECTRIC CO., LTD. 发明人 KONO YOSHINOBU
分类号 H01L21/28;H01L29/739;H01L21/331;H01L21/336;H01L29/08;H01L29/417;H01L29/78 主分类号 H01L21/28
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