摘要 |
In an insulated gate semiconductor device ( 1 ) having an N<SUP>-</SUP> type base region ( 11 ), P<SUP>+</SUP> type collector regions ( 12 ), P type base regions ( 13 ), and N<SUP>+</SUP>type emitter regions ( 14 ), an N<SUP>+</SUP> type collector-short region ( 15 ) which extends toward the N<SUP>-</SUP> type base region ( 11 ) farther than the P<SUP>+</SUP> type collector regions ( 12 ) is formed in the lower surface of the N<SUP>-</SUP> type base region ( 11 ), and a P<SUP>+</SUP> type semiconductor region ( 16 ) is formed between the N<SUP>+</SUP> type collector-short region ( 15 ) and the N<SUP>-</SUP> type base region ( 11 ).
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