发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING THE SAME
摘要 <p>A silicon carbide semiconductor device (90), includes: 1) a silicon carbide substrate (1); 2) a gate electrode (7) made of polycrystalline silicon; and 3) an ONO insulating film (9) sandwiched between the silicon carbide substrate (1) and the gate electrode (7) to thereby form a gate structure, the ONO insulating film (9) including the followings formed sequentially from the silicon carbide substrate (1): a) a first oxide silicon film (O) (10), b) an SiN film (N) (11), and c) an SiN thermally-oxidized film (O) (12, 12a, 12b). Nitrogen is included in at least one of the following places: i) in the first oxide silicon film (O) (10) and in a vicinity of the silicon carbide substrate (1), and ii) in an interface between the silicon carbide substrate (1) and the first oxide silicon film (O) (10). ® KIPO & WIPO 2008</p>
申请公布号 KR20080025209(A) 申请公布日期 2008.03.19
申请号 KR20087004026 申请日期 2006.08.22
申请人 NISSAN MOTOR CO., LTD.;ROHM CO., LTD. 发明人 TANIMOTO SATOSHI;KAWAMOTO NORIAKI;KITOU TAKAYUKI;MIURA MINEO
分类号 H01L29/51;H01L21/28;H01L29/739;H01L29/78 主分类号 H01L29/51
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