发明名称 Measuring assembly and method for measuring a three-dimensionally extended structure
摘要 <p>The arrangement (1) has a mirror arrangement (3) with multiple mirrors (9, 12, 13) that divides a measuring region (5) of an optical sensor into two diverging regions (10, 11) about the mirror (9). The mirrors (9, 12, 13) reunite the diverging regions about the two mirrors (12, 13) in such a manner that reflective regions (14, 15) are intersected in a measuring field (16), where a measurement of a three-dimensional extended structure is effected in the measuring field. A telecentric lens is assigned to the optical sensor. An independent claim is also included for a method for measuring a three-dimensionally extended structure.</p>
申请公布号 EP1901031(A2) 申请公布日期 2008.03.19
申请号 EP20070017870 申请日期 2007.09.12
申请人 MICRO-EPSILON OPTRONIC GMBH 发明人 STAUTMEISTER, TORSTEN, DIPL.-ING.;SCHUELLER, TOBIAS, DR.-ING.
分类号 G01B11/24;G01B11/25 主分类号 G01B11/24
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