| 摘要 |
PROBLEM TO BE SOLVED: To provide a dielectric constant measuring device suitable for evaluation of dielectric materials in the order of nm (nanometer), and a method therefor; and a recording/reproducing device capable of recording and reproducing with high density which is an application of the technology. SOLUTION: The dielectric constant measuring device 1 that measures an dielectric constant of a dielectric includes a cantilever 11 having a fine projection 11b at the side surface of the top end of a beam of conductor 11a, an electrode 14 provided in the circumference of the cantilever 11 and grounded, an inductor L provided so as to configure a resonance circuit with capacitance (Cs) of a micro region of a dielectric to which the cantilever contacts, an oscillator 16 connected to the resonance circuit, an FM demodulator 17 that demodulates an oscillation frequency of the oscillator, and a dielectric constant detector 18 that detects dielectric constant information from the demodulation signal. The dielectric measuring device can be used for an information recording/reproducing device that uses a dielectric recording medium. COPYRIGHT: (C)2008,JPO&INPIT
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