发明名称 Isolation structures for integrated circuits and modular methods of forming the same
摘要 A variety of isolation structures for semiconductor substrates include a trench formed in the substrate that is filled with a dielectric material or filled with a conductive material and lined with a dielectric layer along the walls of the trench. The trench may be used in combination with doped sidewall isolation regions. Both the trench and the sidewall isolation regions may be annular and enclose an isolated pocket of the substrate. The isolation structures are formed by modular implant and etch processes that do not include significant thermal processing or diffusion of dopants so that the resulting structures are compact and may be tightly packed in the surface of the substrate.
申请公布号 US2008048287(A1) 申请公布日期 2008.02.28
申请号 US20070891006 申请日期 2007.08.08
申请人 ADVANCED ANALOGIC TECHNOLOGIES, INC.;ADVANCED ANALOGIC TECHNOLOGIES (HONG KONG) LIMITED 发明人 WILLIAMS RICHARD K.;DISNEY DONALD R.;CHAN WAI T.
分类号 H01L29/00;H01L21/761 主分类号 H01L29/00
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