发明名称 MEASURING METHOD OF DUTY RATIO VARIATION AND CIRCUIT
摘要 PROBLEM TO BE SOLVED: To measure a duty ratio variation of a delay cell. SOLUTION: This method makes connection between an input and an output of the delay cell in a loop shape so as to cause a monopulse signal which has a shorter pulse width than a delay time of the delay cell to be input and circulated in the loop, and counts the number of the monopulse signals which circulate in the loop, and then a duty ratio variation of the delay cell is measured based on the counted value. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008026169(A) 申请公布日期 2008.02.07
申请号 JP20060199494 申请日期 2006.07.21
申请人 KAWASAKI MICROELECTRONICS KK 发明人 NAKAJIMA OSAMU
分类号 G01R29/02 主分类号 G01R29/02
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