发明名称 OPERATING METHOD OF BIPOLAR SEMICONDUCTOR DEVICE AND BIPOLAR SEMICONDUCTOR DEVICE
摘要 <p>A bipolar semiconductor device having a silicon carbide epitaxial film grown from the surface of a silicon carbide single crystal substrate, in which electrons and holes are recombined during conduction in the silicon carbide epitaxial film and expansion of lamination defect area caused by continuous conduction is suppressed. In an operating method of a bipolar semiconductor device, a current is passed through the SiC bipolar semiconductor device while maintaining the temperature environment at 350°C or above.</p>
申请公布号 WO2008015764(A1) 申请公布日期 2008.02.07
申请号 WO2006JP315537 申请日期 2006.08.04
申请人 THE KANSAI ELECTRIC POWER CO., INC.;CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY;SUGAWARA, YOSHITAKA;NAKAYAMA, KOJI;ISHII, RYOSUKE;MIYANAGI, TOSHIYUKI;TSUCHIDA, HIDEKAZU;KAMATA, ISAHO 发明人 SUGAWARA, YOSHITAKA;NAKAYAMA, KOJI;ISHII, RYOSUKE;MIYANAGI, TOSHIYUKI;TSUCHIDA, HIDEKAZU;KAMATA, ISAHO
分类号 H01L29/66;H01L29/74;H01L29/78;H01L29/861 主分类号 H01L29/66
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