发明名称 INSPECTION METHOD FOR MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide an inspection method for a measuring instrument capable of detecting easily abnormality of a lens measuring instrument. SOLUTION: This inspection method for the measuring instrument for inspecting the lens measuring instrument for measuring an optical characteristic of a lens is provided with a measuring process for preparing a reference lens of the same type same to the lens 1 measured by the lens measuring instrument, and for measuring the optical characteristic as to the reference lens by the lens measuring instrument, and an inspection process for measuring the optical characteristic as to the reference lens by the lens measuring instrument, for comparing a measured value therein with a measured value of the optical characteristic measured in the measuring process, and for inspecting the abnormality of the lens measuring instrument, based on whether a difference between the measured values is within a set range or not. The abnormality of the instrument is thereby detected easily and surely using the reference lens. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007322330(A) 申请公布日期 2007.12.13
申请号 JP20060154918 申请日期 2006.06.02
申请人 FUJINON CORP 发明人 KUROSE MINORU;NOGUCHI YASUHIRO
分类号 G01M11/02 主分类号 G01M11/02
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