发明名称 |
ETCHING METHOD, ETCHING MASK, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE EMPLOYING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor etching method capable of easily etching even an semiconductor layer hardly to be etched, such as a group III-V nitride semiconductor by a comparatively simple process. <P>SOLUTION: The semiconductor etching method has a process of forming a metal fluoride layer at a temperature of not less than 150°C as at least one part of an etching mask 3 to be formed on a semiconductor layer 2; a process of patterning the metal fluoride layer; and a process of etching the semiconductor layer using the patterned metal fluoride layer 3 as a mask. <P>COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2007324574(A) |
申请公布日期 |
2007.12.13 |
申请号 |
JP20070120427 |
申请日期 |
2007.04.30 |
申请人 |
MITSUBISHI CHEMICALS CORP |
发明人 |
HORIE HIDEYOSHI |
分类号 |
H01L21/3065;H01L33/06;H01L33/32 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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