发明名称 ETCHING METHOD, ETCHING MASK, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE EMPLOYING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor etching method capable of easily etching even an semiconductor layer hardly to be etched, such as a group III-V nitride semiconductor by a comparatively simple process. <P>SOLUTION: The semiconductor etching method has a process of forming a metal fluoride layer at a temperature of not less than 150&deg;C as at least one part of an etching mask 3 to be formed on a semiconductor layer 2; a process of patterning the metal fluoride layer; and a process of etching the semiconductor layer using the patterned metal fluoride layer 3 as a mask. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007324574(A) 申请公布日期 2007.12.13
申请号 JP20070120427 申请日期 2007.04.30
申请人 MITSUBISHI CHEMICALS CORP 发明人 HORIE HIDEYOSHI
分类号 H01L21/3065;H01L33/06;H01L33/32 主分类号 H01L21/3065
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