| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To prevent all of serially-connected light-emitting diodes in one row from being unlit during an opening failure (an open failure) in the light-emitting diodes by a simple configuration. <P>SOLUTION: Each protection element 52A-52n is connected in parallel to each of a plurality of the serially-connected light-emitting diodes 51A-51n. By this, when the opening failure occurs in the light-emitting diodes, dielectric breakdown of the protection elements connected in parallel to the light-emitting diodes occurs, so as to prevent all of the serially-connected light-emitting diodes in one row from being unlit. The protection element is composed of an insulating layer film-formed between a light-emitting diode chip fixed on a substrate and a wiring pattern formed on the substrate. When the opening failure occurs in the light-emitting diodes, the insulating layer provided between the wiring pattern and a lead terminal of the light-emitting diode chip dielectrically breaks down so as to make conductive between the wiring pattern and the light-emitting diode. <P>COPYRIGHT: (C)2008,JPO&INPIT</p> |
