发明名称 METHOD OF FABRICATING PMOS THIN FILM TRANSISTOR
摘要 A method of fabricating a p-type thin film transistor (TFT) includes: performing a first annealing process on a substrate to diffuse a metal catalyst through a capping layer into a surface of an amorphous silicon layer, and to crystallize the amorphous silicon layer to a polycrystalline silicon layer due to the diffused metal catalyst; removing the capping layer; patterning the polycrystalline silicon layer to form a semiconductor layer; forming a gate insulating layer and a gate electrode on the substrate; implanting p-type impurity ions into the semiconductor layer; and implanting a gettering material into the semiconductor layer and performing a second annealing process to remove the metal catalyst. Herein, the p-type impurity ions are implanted at a dose of 6x10<SUP>13</SUP>/cm<SUP>2 </SUP>to 5x10<SUP>15</SUP>/cm<SUP>2</SUP>, and the gettering material is implanted at a dose of 1x10<SUP>11</SUP>/cm<SUP>2 </SUP>to 3x10<SUP>15</SUP>/cm<SUP>2</SUP>.
申请公布号 US2007284581(A1) 申请公布日期 2007.12.13
申请号 US20070741307 申请日期 2007.04.27
申请人 SAMSUNG SDI CO., LTD. 发明人 YANG TAE-HOON;LEE KI-YONG;SEO JIN-WOOK;PARK BYOUNG-KEON
分类号 H01L21/335;H01L29/04 主分类号 H01L21/335
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