摘要 |
A method of fabricating a p-type thin film transistor (TFT) includes: performing a first annealing process on a substrate to diffuse a metal catalyst through a capping layer into a surface of an amorphous silicon layer, and to crystallize the amorphous silicon layer to a polycrystalline silicon layer due to the diffused metal catalyst; removing the capping layer; patterning the polycrystalline silicon layer to form a semiconductor layer; forming a gate insulating layer and a gate electrode on the substrate; implanting p-type impurity ions into the semiconductor layer; and implanting a gettering material into the semiconductor layer and performing a second annealing process to remove the metal catalyst. Herein, the p-type impurity ions are implanted at a dose of 6x10<SUP>13</SUP>/cm<SUP>2 </SUP>to 5x10<SUP>15</SUP>/cm<SUP>2</SUP>, and the gettering material is implanted at a dose of 1x10<SUP>11</SUP>/cm<SUP>2 </SUP>to 3x10<SUP>15</SUP>/cm<SUP>2</SUP>.
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