发明名称 Metal oxynitride gate
摘要 A metal-oxide-semiconductor (MOS) transistor having a gate electrode comprising a metal oxynitride and a method of forming the same are provided. The metal oxynitride preferably comprises molybdenum oxynitride and/or iridium oxynitride. The gate electrode may further comprise carbon and/or silicon. The gate electrode is preferably formed in a chamber containing nitrogen, oxygen and a carbon-containing gas. The gate electrode of the MOS transistor has a high work function and a low equivalent oxide thickness.
申请公布号 US2007284677(A1) 申请公布日期 2007.12.13
申请号 US20070796164 申请日期 2007.04.26
申请人 CHANG WENG;HU BOQ-KANG;SCHAEFFER JAMIE;GILMER DAVID C;TOBIN PHIL 发明人 CHANG WENG;HU BOQ-KANG;SCHAEFFER JAMIE;GILMER DAVID C.;TOBIN PHIL
分类号 H01L29/76;H01L21/336 主分类号 H01L29/76
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