发明名称 |
HEAT TREATMENT APPARATUS, HEAT TREATMENT METHOD, AND RECORDING MEDIUM RECORDING PROGRAM FOR PRACTICING THE METHOD |
摘要 |
In a heat treatment method in which a semiconductor wafer is carried into a heat treatment chamber constituted of a heat plate and a cover body covering the heat plate and processed, until the wafer is carried into the heat treatment chamber, an opening and closing operation of the cover body is performed to maintain the accumulated heat temperature of the heat treatment chamber at a prescribed processing temperature.
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申请公布号 |
US2007286709(A1) |
申请公布日期 |
2007.12.13 |
申请号 |
US20070740497 |
申请日期 |
2007.04.26 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
FUJII KATSUHISA;ODA TETSUYA;KUBO AKIHIRO |
分类号 |
H01L21/673;G06F19/00;H01L21/027;H01L21/324 |
主分类号 |
H01L21/673 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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