| 摘要 |
PROBLEM TO BE SOLVED: To provide a memory diagnostic apparatus for specifying a defective memory IC by evenly diagnosing each bit that constitutes the memory, using random numbers as diagnostic data, and counting the occurrences of an abnormality in bit units, i.e., the minimum storage units of the memory. SOLUTION: The apparatus includes a CPU for generating random number data for the diagnosis of memory; a memory comprising a plurality of ICs having memory areas specified by a plurality of access addresses and a plurality of bits and integrated for every predetermined bit width, the memory being connected to the CPU via a data bus; and a counting means for comparing, for every bit of the memory, the random number data written in the respective memory area with the random number data read, and counting the occurrences of an abnormality if the comparison result shows that the data do not match. The defective memory IC is specified based on the count value. COPYRIGHT: (C)2007,JPO&INPIT
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