发明名称 Reduction of threshold voltage instabilities in a MOS transistor
摘要 A MOS transistor includes an etch stop layer presenting a density of less than a determined threshold value, below which the material of said stop layer is permeable to molecules of dihydrogen and/or water. The material may comprise a nitride. A material used for the etch stop layer preferably has a density value of less than about 2.4 g/cm<SUP>3</SUP>.
申请公布号 US2007215919(A1) 申请公布日期 2007.09.20
申请号 US20070715268 申请日期 2007.03.06
申请人 STMICROELECTRONICS S.A. 发明人 REGOLINI JORGE;MORIN PIERRE;BENOIT DANIEL
分类号 H01L29/76 主分类号 H01L29/76
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