| 摘要 |
PROBLEM TO BE SOLVED: To accurately perform an operation test even when operation guarantee temperature is set to be high. SOLUTION: A microcomputer 1 comprises a semiconductor substrate 2, input/output circuits 4 and 4A-E, a plurality of heat generating circuits 5A-5D, pads 3A-3C for inputting a control signal S1 for controlling the heat generating circuits, a temperature sensor 7, pads 3D and 3E for outputting a detected signal S3 by a temperature sensor to the outside, a decoder 6, and the like. The input/output circuits are connected with the pads arranged at predetermined intervals on a semiconductor substrate, and have an input/output buffer or the like. The heat generating circuits are arranged near the input/output circuits. The temperature sensor is a pn junction silicon diode. The decoder decodes the control signal generated by a control circuit disposed in a tool for evaluation based on the detected signal by the temperature sensor, and selects a heat generating circuit to be operated according to a decoding result every block. COPYRIGHT: (C)2007,JPO&INPIT |
