发明名称 PLANARIZING EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To form a coated film such as a flat insulating film on a substrate like a wafer without using a chemical mechanical polishing (CMP) device. SOLUTION: A substrate processing system 1 is provided with planarizing equipment 18 that hardens a coated insulating film A before it is hardened in a heating furnace. The planarizing equipment 18 has a spin chuck 71 that holds and rotates a wafer W, a brush 101 that is pressed against the coated insulating film A on the wafer W to grind the surface of the coated insulating film A, a first arm 81 for moving the brush 101 along the surface of the wafer W, a working liquid supply nozzle 110 supplying a working liquid onto the wafer W, and so on. The wafer W having the coated insulating film A in a soft state before being hardened is conveyed to the planarizing equipment 18, and the brush 101 is moved along the surface of the coated insulating film A while it is pressed against the coated insulating film A, thus planarizing the coated insulating film A to a predetermined film thickness. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007243030(A) 申请公布日期 2007.09.20
申请号 JP20060065960 申请日期 2006.03.10
申请人 TOKYO ELECTRON LTD 发明人 TERADA SHOICHI;MIZUNO GOSHI;UEHARA TAKESHI
分类号 H01L21/31;B08B1/02;B08B3/02;B08B3/12;B08B7/04;H01L21/027;H01L21/304 主分类号 H01L21/31
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