发明名称 HIGH DENSITY MEMORY ARRAY FOR LOW POWER APPLICATION
摘要 <p>A high-density memory array for low-power application is provided to read easily a phase change memory cell by using a body effect of an associated MOS selection transistor. A MOS selection transistor(104) has a gate connected to a word line, and source and drain regions each connected between first and second bit lines. A first phase change material element is connected between the first bit line and the source region of the MOS selection transistor. A second phase change material element is connected between the drain region and the second bit line. A sense circuit is adapted to ascertain a state of the first phase change material element by determining a threshold voltage condition of the MOS selection transistor.</p>
申请公布号 KR20070094573(A) 申请公布日期 2007.09.20
申请号 KR20070026346 申请日期 2007.03.16
申请人 QIMONDA AG 发明人 HAPP THOMAS;NIRSCHL THOMAS
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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