发明名称 PROCESSING APPARATUS AND PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a processing apparatus capable of performing the processing with the minimum amount of a processing gas according to the number of wafers to be processed even in a batch system. SOLUTION: By moving a partition 21 in the vertical direction of a chamber 1, an area 4a on one side according to the number of wafers 8 to be processed is set. A processing gas is fed by a three-way valve 13 from a feed pipe 11 opened in a processing chamber 4 of the area 4a on one side, N<SB>2</SB>gas is fed from the feed pipe 11 opened in the processing chamber 4 of an area 4b on the other side. The wafers are processed by using the processing gas of the amount corresponding to the number of wafers 8 to be processed. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007217762(A) 申请公布日期 2007.08.30
申请号 JP20060041044 申请日期 2006.02.17
申请人 SEIKO EPSON CORP 发明人 YAMADA MASATAKA
分类号 C23C16/455;H01L21/205;H01L21/22 主分类号 C23C16/455
代理机构 代理人
主权项
地址