发明名称 |
Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device |
摘要 |
There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a reference voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strobe timing generator for sequentially generating the strobe signals placed almost at equal time intervals, a capture memory for storing the comparison result of the comparator and a digital signal processing section for calculating jitter of the signal-under-test based on the comparison result stored in the capture memory.
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申请公布号 |
US2007203659(A1) |
申请公布日期 |
2007.08.30 |
申请号 |
US20060362536 |
申请日期 |
2006.02.27 |
申请人 |
YAMAGUCHI TAKAHIRO;IWAMOTO SATOSHI;SUDA MASAKATSU;ISHIDA MASAHIRO |
发明人 |
YAMAGUCHI TAKAHIRO;IWAMOTO SATOSHI;SUDA MASAKATSU;ISHIDA MASAHIRO |
分类号 |
G06F19/00 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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