发明名称 STRAIN MEASURING DEVICE AND STRAIN MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To correct simultaneously each wavelength of excitation laser light and Raman scattering light in order to measure highly accurately wavelength shift of the Raman scattering light to the wavelength of the excitation laser light even if wavelength drift of the excitation laser light occurs. SOLUTION: Rayleigh scattering light caused by the Raman scattering light and the excitation laser light 1 from a sample S and reference light 13 are introduced into a multiple wavelength simultaneous detection means 8, and a spectrum of each scattering light 1a and a spectrum of the reference light 13 are measured. Fitting of each spectrum is performed by using Gauss function or the like, to thereby determine a peak wavelength position, and a correction value is determined based on a known wavelength of the reference light 13. The peak position of each spectrum is corrected by using the correction value, and each peak wavelength position of a Raman spectrum and a Rayleigh scattering spectrum is converted into a wave number unit to determine the difference, and a Raman shift is determined. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007218860(A) 申请公布日期 2007.08.30
申请号 JP20060042722 申请日期 2006.02.20
申请人 TOKYO INSTRUMENTS INC 发明人 SURUGA MASAJI;TOCHIGI KENJI
分类号 G01B11/16;G01N21/27;G01N21/65 主分类号 G01B11/16
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