| 摘要 |
PROBLEM TO BE SOLVED: To calibrate highly accurately an observed wavelength by excluding an effect of the whole non-flatness of light emission intensity ripple included in emitted light from a light emitting diode or a light intensity distribution of the light emitting diode. SOLUTION: The method comprises processes for: allowing reference light in a prescribed wavelength band emitted from the light emitting diode to pass a gas absorbing cell for absorbing light having a specific wavelength, and determining an observation spectrum of transmitted light after passing; determining a moving averaging observation spectrum by applying moving averaging processing to the observation spectrum; determining a corrected observation spectrum by taking the ratio between the moving averaging observation spectrum and the observation spectrum; and calibrating the observed wavelength based on the difference between an absorbed wavelength by the gas absorbing cell and a known specific wavelength in the corrected observation spectrum. COPYRIGHT: (C)2007,JPO&INPIT
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