| 摘要 |
PROBLEM TO BE SOLVED: To provide a technology for detecting a micro structure in an object. SOLUTION: The characteristic value regarding an internal structure of the object to be measured is calculated. First, the object to be measured is imparted with a pulse-like static magnetic field, and thereafter, the magnetic field is stopped. The variational rate of a magnetic flux is measured, after the stoppage of application of the magnetic field, regarding the different measurement position of the object to be measured. The characteristic values regarding the internal structure of the object to be measured are calculated, based on the transient variation of the variation rate of the magnetic flux at the different measurement position. COPYRIGHT: (C)2007,JPO&INPIT
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