发明名称 DEVICE AND METHOD FOR TESTING MAGNETIC HEAD
摘要 PROBLEM TO BE SOLVED: To provide a magnetic head test device and test method capable of testing the characteristic of a magnetic head with higher precision, and of heightening the quality of the magnetic head by allowing electromagnetic waves to act on the magnetic head. SOLUTION: The magnetic head test device provided with a magnetic field generating means 20 for allowing magnetic field to act on an object under test 10 where a magnetic head provided with an MR element is formed, and a resistance value detection means 30 for measuring a change in the resistance value of the MR element of the magnetic head formed in the object under test, when the intensity of the magnetic field by the magnetic field generating means is increased or decreased, has a magnetic wave generating means 40 for allowing electromagnetic waves to act on the object 10, and detecting the characteristics of the object under test, in an environment where the electromagnetic waves act. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007218656(A) 申请公布日期 2007.08.30
申请号 JP20060037731 申请日期 2006.02.15
申请人 FUJITSU LTD 发明人 SO USHAKU
分类号 G01R33/09;G01R35/00;G11B5/39;G11B5/455 主分类号 G01R33/09
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