发明名称 ALL AUTOMATIC RETURN SYSTEMS OF SEMICONDUCTOR TESTER AND THE RETURN METHOD
摘要 An automatic power return system of a semiconductor tester and a return method thereof are provided to immediately check the normal operation state of the tester, by automatically returning a power supply unit into a power supply state, and then executing a test operation testing program through transmission of a return signal to a main computer when the power is cut off due to an instantaneous stoppage of power supply. An automatic power return system of a semiconductor tester(300) is composed of a main computer(100) receiving power through an uninterruptible power supply device, controlling the entire test process of a semiconductor device with a stored program, and analyzing the test result; a power supply controller(200) controlled by the main computer to control a driving power source for executing a test of the tester and detect input power of the tester; and the tester testing the semiconductor device according to various signals and driving power applied from the power supply controller and transmitting the test result to the main computer. The power supply controller comprises a first power supply unit(201); a power supply controlling and sensing unit(202); a second power supply unit(203); and an instantaneous power stoppage compensating unit(204) supplying the driving power to the first power supply unit to execute a test operation inspection program of the main computer for checking the normal operation state of the tester if the output of the second power supply unit is abnormal due to a stoppage of AC power supply caused by an instantaneous power failure.
申请公布号 KR20070074824(A) 申请公布日期 2007.07.18
申请号 KR20060002841 申请日期 2006.01.10
申请人 D.I CORPORATION 发明人 HAN, SANG IL;LEE, JONG SEOB;KIM, SOO HO
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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