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发明名称
Method and system for automatically determining electrical properties of a semiconductor wafer or sample
摘要
申请公布号
EP1760459(A3)
申请公布日期
2007.05.02
申请号
EP20060112491
申请日期
2006.04.11
申请人
SOLID STATE MEASUREMENTS, INC.
发明人
HILLARD, ROBERT J.
分类号
G01N27/22;G01R31/312
主分类号
G01N27/22
代理机构
代理人
主权项
地址
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