发明名称 SYSTEM AND METHOD FOR ANALYZING WAVEFRONT ABERRATIONS
摘要 A system and method for specifying a vision correction prescription for a patient's eye, wherein in one embodiment, the method includes obtaining a wavefront aberration measurement of the patient's eye, applying at least one value from the wavefront aberration measurement to a statistical model trained using a plurality of objectively measured aberration values and a plurality subjectively measured visual acuity values as training data; and predicting a vision correction prescription for the patient's eye based on the at least one value and the statistical model.
申请公布号 WO2005079546(A3) 申请公布日期 2007.04.19
申请号 WO2005US05956 申请日期 2005.02.22
申请人 OPHTHONIX, INC.;DREHER, ANDREAS, W.;LAI, SHUI, T. 发明人 DREHER, ANDREAS, W.;LAI, SHUI, T.
分类号 A61B3/00;A61B3/10;B24B13/00;B29D11/00;G02C13/00 主分类号 A61B3/00
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